Sandeep Bhatia’s article for Tech Design Forum is finally online.

The inherent complexity of today’s system-on-chips, with their multiple clock and voltage domains, requires test considerations to be moved further up design flows. The article describes strategies for and benefits from apply test before RTL goes through synthesis, augmenting what is already achieved through memory built-in self test and automatic test pattern generation.

For those of you that don’t know, Tech Design Forum has changed. It is no longer owned by Mentor but is now independent. The main journalists there are Paul Dempsey, Luke Collins and Chris Edwards. They are in the process of reorganizing the site as they take it over.